A new technical paper titled “Aging Aware Steepening of the Fault Coverage Curve of a Scan Based Transition Fault Test Set” ...

It is well established that transition and stuck-at fault models detect the vast majority of production defects. The transition fault model focuses on detecting timing-related defects. However, the ...

Safety mechanisms designed to handle rare events can become unreliable under sustained or intense fault conditions.

The electronics industry is in the midst of a transformation that is drastically changing product design and manufacture. Deep submicron process technology puts more gates on a chip, and the ...

EAST AURORA, N.Y.--(BUSINESS WIRE)--Astronics Corporation (NASDAQ:ATRO), a leading provider of advanced technologies for the global aerospace, defense and semiconductor industries, announced today ...

Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

The current shift in the test methodologies is away from the ubiquitous single stuck-at fault model. The best test for any device is to exhaustively test the device. The quality of such a test would ...

The 2002 NEC implemented new requirements to help reduce the number of electrical fires caused by parallel arc faults in branch circuit wiring. All branch circuits supplying bedrooms in single-family ...