JEOL USA, a supplier of electron microscopes and scientific instruments for nanotechnology, has announced that it has completed installation and acceptance of its first thermal field emission electron ...

Electron microprobe analysis is a sensitive technique for non-destructive quantification of the chemical composition of in situ micrometer volumes of solid material (minerals, alloys, ceramics, glass, ...

Electron microprobe analysis is a sensitive technique for non-destructive quantification of the chemical composition of in situ micrometer volumes of solid mate- rial (minerals, alloys, ceramics, ...

The instrument is a dedicated field emission, wavelength dispersive electron microprobe (EPMA). Quantitative elemental data can be obtained from most elements (Fluorine to Uranium) with detection ...

JEOL, a leading manufacturer of electron microscopes for over fifty years, has introduced an advanced electron probe microanalyzer (EPMA) with a thermal field emission electron gun designed ...

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