Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Local defects in water layers growing on metal surfaces have a key influence on the wetting process at the surfaces; however, such minor structures are undetectable by macroscopic methods. Here, we ...

NC-AFM 2026 is the 27 th of a series of conferences devoted to non-contact atomic force microscopy. The conference covers ...

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Park Systems serves its customers with a complete range of AFM solutions including AFM systems, options, and software, along with global service and support. Park Systems provides original and ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Automated features enhance efficiency, but ...

Atomic Force Microscopy (AFM) is an advanced material imaging technique, which is able to provide accurate topographic images of a surface. It was created by Gerd Binning and Heinrich Rohrer in 1986 ...

Biopolymers are polysaccharides that come from natural sources and are not the same as manufactured biodegradable materials. Some biopolymers have been discovered to have ionic and electronic ...