EDN

Inspecting the wafer test

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...
EDN

Hynix Uses Teradyne Wafer Probe For DRAM Wafer Test

Teradyne Inc. today announced Hynix Semiconductor Inc. has evaluated high-speed wafer test at its facility in Ichon, South Korea, using a Teradyne wafer probe system. Boston-based Teradyne (nyse: TER) ...
Semiconductor Engineering

Managing Wafer Retest

Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
AZOM

Wafer Probe Stations for Semiconductor Testing

In this interview, Jeremy Hope from Wentworth Laboratories talks to AZoM about why they are attending electronica. Please tell us about the company Wentworth Labs and why you are attending electronica ...
Electronic Design

Testing MEMS at Wafer Level

Although it requires a new generation of test equipment, testing MEMS devices is challenging but not impossible. Since the early days of the IC industry, wafer-level test has been possible using ...