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Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical specificity with high-resolution imaging.

Kanazawa University, in collaboration with Osaka University and the National Institutes for Quantum Science and Technology, ...

Abstract: Atomic force microscope (AFM) is the instrument that can measure the surface of samples on the nano-scale. Most of the controllers of commercial AFMs are designed by classic control theory.

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In this interview, industry expert Louis Pacheco explores how advanced AFM techniques are transforming the characterization of solid-state polymer batteries, enabling researchers to optimize ...

Two years ago, in my early quest to understand what would become AI Overviews, I declared that Retrieval Augmented Generation was the future of search. With AI Overviews and now AI Mode wreaking havoc ...

1 Electrical and Computer Engineering, Iowa State University, Ames, IA, United States 2 Mechanical Engineering, Iowa State University, Ames, IA, United States Atomic force microscopy (AFM) is a part ...