Abstract: The 0-1 Knapsack Problem (KP) and Bin Packing Problem (BPP) are NP-hard combinatorial optimization challenges often tackled using metaheuristics. Both problems have prominent utilization in ...
Abstract: Memory built-in self-test (MBIST) is an important design-for-test (DFT) technique for embedded memories, and MBIST grouping is the most significant part of it. However, as the number of ...
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