Abstract: The destructive testing for reliability analysis at high-power microwave (HPM) in the GaAs/InGaP hetero-junction bipolar transistor (HBT) has been rarely investigated although it has a ...

An SCR topology transmogrifies into BJT two-wire precision current source with a self-resetting fault-current limiter.

Abstract: This article details the applicability of a thin-film piezotronic bipolar junction transistor as a wearable energy harvester that is capable of signal rectification without any extra and ...