Abstract: Minimizing the testing cost is crucial in the context of the design for test (DFT) flow. In our observation, the test patterns generated by commercial ATPG tools in test compression mode ...
Abstract: In recent years, the number of test vectors has increased due to VLSI circuit density and complexity. A test compaction technique can reduce the number of test vectors without losing fault ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback