Provide practical KPIs to monitor, including FA hit rate (percent of FAs that find root cause) and time to address yield ...
Abstract: With the biennial doubling of the number of transistors in a given area of silicon, contemporary integrated circuits (IC) are forging more and more often and will continue to forge complex ...
Abstract: This paper presents a two-dimensional (2D) wide-angle scanning phased array based on a pattern reconfigurable two-element subarray. The two-element subarray design method enables flexible 1D ...
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