The future of chips: how gate-all-around design is powering the AI era and the next node

The industry’s answer is gate-all-around (GAA). This design wraps the gate material completely around all sides, including ...
Semiconductor Engineering

The Design Challenges Of Clock Integrity And Clock Jitter

Races, missed next-state values due to long paths, and metastability can result from corrupted clock signals. This post describes the challenges of clock network and clock jitter analysis in more ...
IEEE

Extraction of Subgap Density of States in Amorphous In–Ga–Zn–O Thin-Film Transistors by Measuring Capacitor-on-Gate Structure

Abstract: A new field-effect method for extracting subgap density of states (DOS) using a capacitor-on-gate structure, which requires only two transfer curves measured at room temperature, is proposed ...